Multiphoton-LP-Beamsplitter HC 775 LP
Product information "Multiphoton-LP-Beamsplitter HC 775 LP"
AOI 45°
Reflection 350 - 760 nm >98% avg.
Transmission 790 - 1600 nm >93% avg.
Dimension 25,2 x 35,6 x 1,1 mm
Reflection 350 - 760 nm >98% avg.
Transmission 790 - 1600 nm >93% avg.
Dimension 25,2 x 35,6 x 1,1 mm
Spezifikationen
| OEM/Original number: | |
|---|---|
| Reflection Band 1: | Ravg > 98% 350 - 760 nm |
| Edge Wavelength 1: | 775 nm |
| Transmission Band 1: | Tavg > 93% 790 - 1600 nm |
| Angle of Incidence: | 45 ± 1.5 degrees |
| Cone Half-angle: | 2 degrees |
| Optical Damage Rating: | Testing has proven to show no signs of degradation when exposed to at least 6.0 W of power from an unfiltered xenon arc lamp over a 25 mm diameter (corresponding to 1.2 W/cm2) for over 500 hrs. |
| Steepness: | Standard |
| Filter Effective Index: |
1.52 Understanding `Effective Index of Refraction` neff |
| Substrate type: | low-autofluorescence optical quality glass |
| Flatness / RWE Classification: | Laser |
| Reflected Wavefront Error: | < 6λ P-V RWE @ 632.8 nm |
| Transverse Dimensions (L x W): | 25.2 mm x 35.6 mm |
| Transverse Tolerance: | ± 0.1 mm |
| Filter Thickness (unmounted): | 1.05 mm |
| Filter Thickness Tolerance (unm: | ± 0.05 mm |
| Clear Aperture: | ≥ 80% (elliptical) |
| Scratch-Dig: | 60-40 |
| Substrate thickness: | 1.05 mm |
| Orientation: | Reflective surface marked with part number - Orient in direction of incoming light |
| Other physical specs: | Standard Specifications of Our Filters and Beam Splitters |
| Application (bs): | for multiphoton applications |
| CWL/EdgeWL/NotchWL (nm): | 775 |
| Size: | 25,2 x 35,6 mm |
| Type (beamsplitter): | Longpass |
| Warranty: | 10 years |
| suitable for: | Laser applications |
| Number of Bands/Edges/Notches: | 1 |
| Substrate Thickness: | 1 mm |
| Damage Threshold: | no signs of degradation acc. to testing |
| Scratch-Dig: | 60-40 |