Transmission 780 - 950 nm
25,2 x 35,6 x 2 mm image flat
OEM/Original number: | FF765-Di01-25x36x2.0 |
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Edge Wavelength 1: | 765 nm |
Transmission Band 1: | Tavg > 93% 780 - 950 nm |
Angle of Incidence: | 45 ± 1.5 degrees |
Cone Half-angle: | 2 degrees |
Optical Damage Rating: | Testing has proven to show no signs of degradation when exposed to at least 6.0 W of power from an unfiltered xenon arc lamp over a 25 mm diameter (corresponding to 1.2 W/cm2) for over 500 hrs. |
Steepness: | Standard |
Filter Effective Index: |
1.86 Understanding `Effective Index of Refraction` neff |
Substrate type: | low-autofluorescence optical quality glass |
Flatness / RWE Classification: | Image-splitting |
Reflected Wavefront Error: | < 2λ P-V RWE @ 632.8 nm |
Transverse Dimensions (L x W): | 25.2 mm x 35.6 mm |
Transverse Tolerance: | ± 0.1 mm |
Filter Thickness (unmounted): | 2.0 mm |
Filter Thickness Tolerance (unm: | ± 0.1 mm |
Clear Aperture: | ≥ 80% (elliptical) |
Scratch-Dig: | 60-40 |
Substrate thickness: | 2.0 mm |
Orientation: | Reflective surface marked with part number - Orient in direction of incoming light |
Other physical specs: | Standard Specifications of Our Filters and Beam Splitters |
CWL/EdgeWL/NotchWL (nm): | 765 |
Number of Bands/Edges/Notches: | 1 |
Size: | 25,2 x 35,6 mm |
Steepness: | Standard für Fluoreszenz |
Substrate Thickness: | 2,0 mm |
Type (beamsplitter): | Langpass |
Warranty: | 10 Jahre |
suitable for: | Image-Splitting |
Damage Threshold: | no signs of degradation acc. to testing |
Scratch-Dig: | 60-40 |