Multiphoton Strahlenteiler HC 835 SP
Produktinformationen "Multiphoton Strahlenteiler HC 835 SP"
AOI 45°
für 2P und 3P Applikationen
Reflexion 1200-1350 und 1600-1870 nm >90% durchschn.
Transmission 400-820 nm >90% durchschn.
Abmessung 25,2 x 35,6 x 1,1 mm
Ebenheit <= 2,5 lambda pv/inch 2,5="" lambda="">
für 2P und 3P Applikationen
Reflexion 1200-1350 und 1600-1870 nm >90% durchschn.
Transmission 400-820 nm >90% durchschn.
Abmessung 25,2 x 35,6 x 1,1 mm
Ebenheit <= 2,5 lambda pv/inch 2,5="" lambda="">
Spezifikationen
| OEM-/Originalnummer: | FF835-SDi01-t1-25x36 |
|---|---|
| Reflection Band 1: | Ravg > 94% 1200 - 1350 nm |
| Edge Wavelength 1: | 835 nm |
| Reflection Band 1 (p-pol): | Ravg > 90% 1200 - 1350 nm |
| Transmission Band 1: | Tavg > 90% 400 - 820 nm |
| Reflection Band 1 (s-pol): | Ravg > 98% 1200 - 1350 nm |
| Reflection Band 2: | Ravg > 94% 1600 - 1870 nm |
| Transmission Band 2: | Tavg >= 80% 400 - 420 nm (Rolling Window: 10 nm) |
| Reflection Band 2 (p-pol): | Ravg > 90% 1600 - 1870 nm |
| Reflection Band 2 (s-pol): | Ravg > 98% 1600 - 1870 nm |
| Transmission Band 3: | Tavg > 90% 420 - 820 nm (Rolling Window: 10 nm) |
| Laser Wavelengths 1: | 1200 - 1350 nm |
| Laser Wavelengths 2: | 1600 - 1870 nm |
| Angle of Incidence: | 45 ± 1.5 degrees |
| Cone Half-angle: | 2 degrees |
| Optical Damage Rating: | 1 J/cm² @ 532 nm (10 ns pulse width) |
| Filter Effective Index: |
1.87 Understanding `Effective Index of Refraction` neff |
| Group Delay Dispersion: | ± 1500 fs² over 1200 - 1350 nm reflection band for S-Pol and P-Pol |
| Substrate type: | low-autofluorescence optical quality glass |
| Reflected Wavefront Error (3 mm: | < 0.33λ P-V RWE @ 632.8 nm |
| Flatness / RWE Classification: | Super-resolution / TIRF |
| Reflected Wavefront Error: | < 2,5λ P-V RWE @ 632.8 nm |
| Maximum Relfected Laser Beam Di: | 6 mm |
| Transverse Dimensions (L x W): | 25.2 mm x 35.6 mm |
| Transverse Tolerance: | ± 0.1 mm |
| Filter Thickness (1 mm, unmount: | 1.05 mm |
| Filter Thickness Tolerance (1 m: | ± 0.05 mm |
| Clear Aperture: | ≥ 80% (elliptical) |
| Scratch-Dig: | 60-40 |
| Substrate Thickness (1 mm, unmo: | 1.05 mm |
| Substrate Thickness Tolerance (: | ± 0.05 mm |
| Orientation: | Reflective surface marked with laser dot - Orient in direction of incoming light |
| Other physical specs: | Standard Specifications of Our Filters and Beam Splitters |
| Abmessungen: | 25,2 x 35,6 mm |
| Anzahl Bänder/Kanten/Notch: | 1 |
| Art des Strahlenteilers: | Kurzpass |
| Garantie: | 10 Jahre |
| Kantensteilheit: | Standard für Fluoreszenz |
| Anwendung (bs): | Multiphoton |
| geeignet für: | Laser-Anwendungen |
| Substratdicke: | 1 mm |
| Damage Threshold: | no signs of degradation acc. to testing |
| Scratch-Dig: | 60-40 |