LaserMUX™ Strahlenteiler 439-458R

285,00 €*

Lieferzeit: ca. 2–5 Wochen

Artikel-Nr.: F38-M02
Produktinformationen "LaserMUX™ Strahlenteiler 439-458R"
AOI 45°
Reflexion 439-458 nm
Transmission 473-685 nm >95%
Durchmesser 25 mm, Ringdicke 3,5 mm
(Substratdicke 2.0 mm)
Spezifikationen
OEM-/Originalnummer: LM01-466-25
Reflection Band 1: Ravg > 98% 439.0 - 457.9 nm
Reflection Band 1 (p-pol): Rabs > 96% for laser wavelengths
Reflection Band 1 (s-pol): Rabs > 99% for laser wavelengths
Edge Wavelength 1: 466 nm
Transmission Band 1: Tavg > 95% 473.0 - 647.1 nm
Transmission Band 1 (p-pol): Tabs > 95% for transmitted laser wavelengths
Transmission Band 1 (s-pol): Tabs > 94% for transmitted laser wavelengths
Angle of Incidence: 45 degrees with a shift of 0.35%/degree (40 - 50 degrees)
Cone Half-angle: 0 degrees
Optical Damage Rating: 1 J/cm2 @ 532 nm (10 ns pulse width)
Transition Width (%): 3.3%
Laser Wavelengths 1: 440 +3/-1, 457.9 nm
Steepness: Standard
Transmitted Laser Wavelengths: 473 +5/-0, 488 +3/-2, 514.5, 515, 532, 543.5, 561.4, 568.2, 594.1, 632.8, 635 +7/-0, 647.1 nm
Filter Effective Index: 1.87
Understanding `Effective Index of Refraction` neff
Substrate type: low-autofluorescence optical quality glass
Flatness / RWE Classification: Laser
Reflected Wavefront Error: < 6λ P-V RWE @ 632.8 nm
Transverse Dimensions (Diameter: 25 mm
Transverse Tolerance: + 0.0 / - 0.1 mm
Filter Thickness (mounted): 3.5 mm
Filter Thickness Tolerance (mou: ± 0.1 mm
Clear Aperture: ≥ 22 mm
Scratch-Dig: 60-40
Substrate thickness: 2.0 mm
Orientation: For optimal filter performance, when using the filter as a:
● MUX: Arrow points toward outgoing transmitted & combined laser beams
● DEMUX: Arrow points toward incoming combined beams and outgoing reflected beam
Other physical specs: Standard Specifications of Our Filters and Beam Splitters
Abmessungen: D = 25 mm
Anzahl Bänder/Kanten/Notch: 1
Art des Strahlenteilers: Langpass
Garantie: 10 Jahre
Kantensteilheit: Standard für Fluoreszenz
Laserwellenlänge (nm): 442
Anwendung (bs): Laser-Anwendung
CWL/EdgeWL/NotchWL (nm): 466, 466
geeignet für: Laser-Anwendungen
Substratdicke: 2,0 mm
Damage Threshold: 1 J/cm² @ 532 nm (10 ns pulse width)
Scratch-Dig: 60-40