Strahlenteiler HC 580 imaging flat
Produktinformationen "Strahlenteiler HC 580 imaging flat"
AOI 45°
Reflexion 350-570 nm >95%
Transmission 591-950 nm >93%
Abmessung 25,2 x 35,6 x 3 mm
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Reflexion 350-570 nm >95%
Transmission 591-950 nm >93%
Abmessung 25,2 x 35,6 x 3 mm
< 0.2 lambda p-v rwe @ 632.8 nm 0.2="" lambda="" p-v="" rwe="" @="" 632.8="">
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Spezifikationen
| OEM-/Originalnummer: | FF580-FDi02-t3 |
|---|---|
| Reflection Band 1: | Ravg > 95% 350 - 570 nm |
| Edge Wavelength 1: | 580 nm |
| Transmission Band 1: | Tavg > 93% 590.8 - 1200 nm |
| Common Fluorophore Pair to Spli: | GFP/mCherry or FITC/TxRed |
| Angle of Incidence: | 45 ± 1.5 degrees |
| Cone Half-angle: | 2 degrees |
| Optical Damage Rating: | Testing has proven to show no signs of degradation when exposed to at least 6.0 W of power from an unfiltered xenon arc lamp over a 25 mm diameter (corresponding to 1.2 W/cm2) for over 500 hrs. |
| Steepness: | Standard |
| Filter Effective Index: |
1.84 Understanding `Effective Index of Refraction` neff |
| Substrate type: | low-autofluorescence optical quality glass |
| Reflected Wavefront Error (3 mm: | < 0.2λ P-V RWE @ 632.8 nm |
| Flatness / RWE Classification: | Image-splitting |
| Transverse Dimensions (L x W): | 25.2 mm x 35.6 mm |
| Transverse Tolerance: | ± 0.1 mm |
| Filter Thickness (3 mm, unmount: | 3.0 mm |
| Filter Thickness Tolerance (3 m: | ± 0.1 mm |
| Clear Aperture: | ≥ 80% (elliptical) |
| Scratch-Dig: | 60-40 |
| Substrate Thickness (3 mm, unmo: | 3.0 mm |
| Orientation: | Reflective surface marked with laser dot - Orient in direction of incoming light |
| Other physical specs: | Standard Specifications of Our Filters and Beam Splitters |
| Abmessungen: | 25,2 x 35,6 mm |
| Anzahl Bänder/Kanten/Notch: | 1 |
| Art des Strahlenteilers: | Langpass |
| Garantie: | 10 Jahre |
| Kantensteilheit: | Standard |
| CWL/EdgeWL/NotchWL (nm): | 580 |
| Anwendung (bs): | Super-resolution |
| geeignet für: | Image-Splitting |
| Substratdicke: | 3,0 mm |
| Scratch-Dig: | 60-40 |