Reflexion 350-528 nm
Transmission 547-1200 nm
Abmessung 25,2 x 35,6 x 3 mm
OEM-/Originalnummer: | FF538-FDi02-t3-25x36 |
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Reflection Band 1: | Ravg > 95% 350 - 528.4 nm |
Edge Wavelength 1: | 538 nm |
Transmission Band 1: | Tavg > 93% 547.7 - 1200 nm |
Common Fluorophore Pair to Spli: | GFP/mOrange |
Angle of Incidence: | 45 ± 1.5 degrees |
Cone Half-angle: | 2 degrees |
Optical Damage Rating: | Testing has proven to show no signs of degradation when exposed to at least 6.0 W of power from an unfiltered xenon arc lamp over a 25 mm diameter (corresponding to 1.2 W/cm2) for over 500 hrs. |
Steepness: | Standard |
Filter Effective Index: |
1.96 Understanding `Effective Index of Refraction` neff |
Substrate type: | low-autofluorescence optical quality glass |
Reflected Wavefront Error (3 mm: | < 0.2λ P-V RWE @ 632.8 nm |
Flatness / RWE Classification: | Image-splitting |
Transverse Dimensions (L x W): | 25.2 mm x 35.6 mm |
Transverse Tolerance: | ± 0.1 mm |
Filter Thickness (3 mm, unmount: | 3.0 mm |
Filter Thickness Tolerance (3 m: | ± 0.1 mm |
Clear Aperture: | ≥ 80% (elliptical) |
Scratch-Dig: | 60-40 |
Substrate Thickness (3 mm, unmo: | 3.0 mm |
Orientation: | Reflective surface marked with laser dot - Orient in direction of incoming light |
Other physical specs: | Standard Specifications of Our Filters and Beam Splitters |
Abmessungen: | 25,2 x 35,6 mm |
Anzahl Bänder/Kanten/Notch: | 1 |
Art des Strahlenteilers: | Langpass |
Garantie: | 10 Jahre |
Kantensteilheit: | Standard |
CWL/EdgeWL/NotchWL (nm): | 538 |
Anwendung (bs): | Super-resolution |
geeignet für: | Image-Splitting |
Substratdicke: | 3,0 mm |
Damage Threshold: | no signs of degradation acc. to testing |
Scratch-Dig: | 60-40 |