Produktinformationen "422/503/572 HC Tripleband Filter"
Durchmesser 25 mm
Spezifikationen
| OEM-/Originalnummer: | FF01-422/503/572-25 |
|---|---|
| Transmission Band 1: | Tavg > 90% 407 - 437 nm |
| Center Wavelength 1: | 422 nm |
| FWHM Bandwidth 1 (nominal): | 36.3 nm |
| Blocking Band 1: | ODavg > 6 275 - 396 nm |
| Transmission Band 2: | Tavg > 90% 494 - 512 nm |
| Guaranteed Minimum Bandwidth 1: | 30 nm |
| Center Wavelength 2: | 503 nm |
| Guaranteed Minimum Bandwidth 2: | 18 nm |
| FWHM Bandwidth 2 (nominal): | 23.9 nm |
| Blocking Band 2: |
ODavg > 8 450 - 480 nm Design specification measurements are noise-floor limited |
| Transmission Band 3: | Tavg > 90% 563 - 581 nm |
| Center Wavelength 3: | 572 nm |
| Guaranteed Minimum Bandwidth 3: | 18 nm |
| FWHM Bandwidth 3 (nominal): | 23.4 nm |
| Blocking Band 3: |
ODavg > 8 527 - 547 nm Design specification measurements are noise-floor limited |
| Blocking Band 4: |
ODavg > 8 598 - 648 nm Design specification measurements are noise-floor limited |
| Blocking Band 5: | ODavg > 4 664 - 925 nm |
| Angle of Incidence: | 0 ± 5 degrees |
| Cone Half-angle: | 7 degrees |
| Optical Damage Rating: | Testing has proven to show no signs of degradation when exposed to at least 6.0 W of power from an unfiltered xenon arc lamp over a 25 mm diameter (corresponding to 1.2 W/cm2) for over 500 hrs. |
| Substrate type: | low-autofluorescence optical quality glass |
| Transverse Dimensions (Diameter: | 25 mm |
| Transverse Tolerance: | + 0.0 / - 0.1 mm |
| Filter Thickness (mounted): | 5.0 mm |
| Filter Thickness Tolerance (mou: | ± 0.1 mm |
| Clear Aperture: | ≥ 21 mm |
| Scratch-Dig: | 60-40" |
| Substrate thickness: | 2.0 mm |
| Orientation: | Arrow on ring indicates preferred direction of propagation of light |
| Other physical specs: | Standard Specifications of Our Filters and Beam Splitters |
| : | ---------------------------------------------- |
| Abmessungen: | D = 25 mm |
| Anzahl Bänder/Kanten/Notch: | 3 |
| Art des Filters: | Multiband |
| Blockungsstärke: | OD 6 |
| CWL/EdgeWL/NotchWL (nm): | 422, 503, 572 |
| Anwendung (Filter): | Standard/Fluoreszenz |
| Substratdicke: | 2,0 mm |
| Scratch-Dig: | 60-40 |
| freie Apertur: | >= 21 mm |