Multiphoton LP-Strahlenteiler HC 850 LP
Produktinformationen "Multiphoton LP-Strahlenteiler HC 850 LP"
AOI 45°
Reflexion 670 - 815 nm >95% durchschn.
Transmission 890 - 2100 nm >93%
Gruppenlaufzeitdispersion:
691-795 nm ± 100 fs² in Reflection
965-2050 nm ± 100 fs² in Transmission (excluding substrate)
Abmessung 25,2 x 35,6 x 1,1 mm
Reflexion 670 - 815 nm >95% durchschn.
Transmission 890 - 2100 nm >93%
Gruppenlaufzeitdispersion:
691-795 nm ± 100 fs² in Reflection
965-2050 nm ± 100 fs² in Transmission (excluding substrate)
Abmessung 25,2 x 35,6 x 1,1 mm
Spezifikationen
| OEM-/Originalnummer: | FF850-Di01-t1 |
|---|---|
| Reflection Band 1: | Ravg > 95% 670 - 815 nm over any 10 nm window |
| Reflection Band 1 (p-pol): | Ravg > 90% 670 - 815 nm |
| Reflection Band 1 (s-pol): | Ravg > 98% 670 - 849 nm |
| Transmission Band 1: | Tavg > 93% 890 - 2100 nm over any 10 nm window |
| Transmission Band 1 (p-pol): | Tavg > 95% 845 - 2100 nm |
| Transmission Band 1 (s-pol): | Tavg > 90% 890 - 2100 nm |
| Angle of Incidence: | 45 ± 1.5 degrees |
| Cone Half-angle: | 1.5 degrees |
| Optical Damage Rating: | 50 mJ/cm² @ 800 nm (50 fs pulse width) |
| Transmitted Wavefront Error: | λ/10 P-V over CA 632.8 nm |
| Group Delay Dispersion Reflecti: |
± 100 fs² over 691 - 795 nm ± 500 fs² over 683 - 812 nm |
| Group Delay Dispersion Reflecti: |
± 100 fs² over 670 - 828 nm ± 500 fs² over 670 - 840 nm |
| Group Delay Dispersion Transmis: |
± 100 fs² over 917 - 2050 nm (excluding substrate, by design) ± 500 fs² over 873 - 2100 nm (excluding substrate, by design) |
| Group Delay Dispersion Transmis: |
± 100 fs² over 965 - 2050 nm (excluding substrate, by design) ± 500 fs² over 913 - 2100 nm (excluding substrate, by design) |
| Substrate type: | low-autofluorescence optical quality glass |
| Flatness / RWE Classification: | Super-resolution / TIRF |
| Reflected Wavefront Error: | 1λ P-V RWE @ 632.8 nm |
| Transverse Dimensions (L x W): | 25.2 mm x 35.6 mm |
| Transverse Tolerance: | ± 0.1 mm |
| Filter Thickness (1 mm), unmount: | 1.05 mm |
| Filter Thickness Tolerance (1 mm): | ± 0.05 mm |
| Clear Aperture: | ≥ 85% (elliptical) |
| Scratch-Dig: | 60-40 |
| Substrate Thickness (1 mm), unmounted: | 1.05 mm |
| Substrate Thickness Tolerance (: | ± 0.05 mm |
| Other physical specs: | Standard Specifications of Our Filters and Beam Splitters |
| : | ---------------------------------------------- |
| Abmessungen: | 25,2 x 35,6 mm |
| Anzahl Bänder/Kanten/Notch: | 1 |
| Art des Strahlenteilers: | Langpass |
| Garantie: | 10 Jahre |
| CWL/EdgeWL/NotchWL (nm): | 850 |
| Anwendung (bs): | Multiphoton |
| geeignet für: | Laser-Anwendungen |
| Substratdicke: | 1 mm |
| Damage Threshold: | 50 mJ/cm² @ 800 nm (50 fs pulse width) |
| Scratch-Dig: | 60-40 |