Produktinformationen "Laser-Strahlenteiler HC R785 1 lambda PV flat"
Laser Wavelengths 780 nm, 785 nm, 790nm
Reflexion 780-790 nm >98% für s-pol.
Reflexion 780-790 nm >90% für p-pol.
Reflexion 780-790 nm >94%
Reflexion 350-780 nm >90% durchschnittlich
Kantenwellenlänge: 800 nm
Transmission 804,3 - 1600,0 nm >93% durchschnittlich
EBENHEIT: max. 1 lambda P-V RWE @ 632.8 nm
Abmessung 25,2 x 35,6 x 1,05 mm
Spezifikationen
| OEM-/Originalnummer: | Di03-R785-t1-25x36 |
|---|---|
| Reflection Band 1: | Rabs > 94% 780 - 790 nm |
| Reflection Band 1 (p-pol): | Rabs > 90% 780 - 790 nm |
| Reflection Band 1 (s-pol): | Rabs > 98% 780 - 790 nm |
| Transmission Band 1: | Tavg > 93% 804.3 - 1600 nm |
| Laser Wavelengths 1: | 780 nm, 785 nm, 790nm |
| Angle of Incidence: | 45 degrees with a shift of 0.35%/degree (40 - 50 degrees) |
| Cone Half-angle: | 0.5 degrees |
| Optical Damage Rating: | 1 J/cm² @ 532 nm (10 ns pulse width) |
| Substrate type: | low-autofluorescence optical quality glass |
| Reflected Wavefront Error (3 mm): | < 0.2λ P-V RWE @ 632.8 nm |
| Flatness / RWE Classification: | Super-resolution / TIRF |
| Reflected Wavefront Error: | < 1λ P-V RWE @ 632.8 nm |
| Transverse Dimensions (L x W): | 25.2 mm x 35.6 mm |
| Transverse Tolerance: | ± 0.1 mm |
| Filter Thickness (unmounted): | 1.05 mm |
| Filter Thickness Tolerance (unm: | ± 0.05 mm |
| Filter Thickness (3 mm), unmount: | 3.0 mm |
| Filter Thickness Tolerance (3 mm): | ± 0.1 mm |
| Clear Aperture: | ≥ 80% (elliptical) |
| Scratch-Dig: | 60-40 |
| Substrate Thickness (1 mm), unmounted: | 1.05 mm |
| Substrate Thickness Tolerance (: | ± 0.05 mm |
| Substrate Thickness (3 mm), unmounted: | 3.0 mm |
| Other physical specs: | Standard Specifications of Our Filters and Beam Splitters |
| : | ---------------------------------------------- |
| Abmessungen: | 25,2 x 35,6 mm |
| Anzahl Bänder/Kanten/Notch: | 1 |
| Art des Strahlenteilers: | Langpass |
| Garantie: | 10 Jahre |
| Kantensteilheit: | Standard |
| Laserwellenlänge: | 785 |
| geeignet für: | Laser-Anwendungen |
| Damage Threshold: | 1 J/cm² @ 532 nm (10 ns pulse width) |
| Scratch-Dig: | 60-40 |